000 01652cam a2200433 a 4500
999 _c6710
_d6710
001 19020
003 BD-DhSEU
005 20240416142109.0
008 110418s2012 iia b 001 0 eng
010 _a 2011009912
015 _aGBB174671
_2bnb
016 7 _a015829915
_2Uk
020 _a9780073529578
020 _a9780073529578
_c655.00
020 _a0073529575
020 _a9780071317061 (international ed. : pbk.)
020 _a0071317066 (international ed. : pbk.)
035 _a(OCoLC)ocn713567280
040 _aDLC
_beng
_cDLC
_dYDX
_dYDXCP
_dCDX
_dBWX
_dUKMGB
_dSITPL
_dUPM
_dOCLCO
_dDLC
_dBD-DhSEU
042 _apcc
050 0 0 _aTK454
_b.H4 2012
082 0 0 _222
_a621.3815
_bH426e
100 1 _aHayt, William H.
_q(William Hart),
_cJr.,
_d1920-1999.
_98522
245 1 0 _aEngineering circuit analysis /
_cWilliam H. Hayt, Jr., Jack E. Kemmerly and Steven M. Durbin.
250 _a8th ed.
260 _aNew Delhi :
_bMcGraw-Hill,
_cc2012.
300 _axx, 852 p. :
_bills. ;
_c26 cm.
504 _aIncludes bibliographical references and index.
526 _aEEE
650 0 _aElectric circuit analysis.
650 0 _aElectric network analysis.
700 1 _aKemmerly, Jack E.
_q(Jack Ellsworth),
_d1924-1998.
_927297
700 1 _aDurbin, Steven M.
_927298
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy1301/2011009912-d.html
856 4 1 _3Table of contents only
_uhttp://www.loc.gov/catdir/enhancements/fy1301/2011009912-t.html
906 _a7
_bcbc
_corignew
_d1
_eecip
_f20
_gy-gencatlg
942 _2ddc
_cBK